GROWTH AND CHARACTERIZATION OF SINGLE-CRYSTALS OF KDP FAMILY

被引：26

作者：

BELOUET, C

机构：

来源：

PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1980年 / 3卷 / 2-3期

关键词：

D O I：

10.1016/0146-3535(80)90016-7

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：121 / 156

页数：36

共 109 条

[1] LINEAR ELECTRO-OPTIC EFFECTS IN TETRAGONAL PHOSPHATES AND ARSENATES [J].

ADHAV, RS .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1969, 59 (04) :414-&

[2]

ALBON N, 1959, ACTA CRYSTALLOGR, V2, P219

[3] X-RAY DIFFRACTION PHENOMENA IN ELASTICALLY DISTORTED CRYSTALS [J].

ANDO, Y ;

KATO, N .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 :74-&

[4]

Authier A., 1972, Journal of Crystal Growth, V13-14, P34, DOI 10.1016/0022-0248(72)90058-9

[5] X-RAY DYNAMICAL CONTRAST OF A PLANAR DEFECT [J].

AUTHIER, A ;

MILNE, AD ;

SAUVAGE, M .

PHYSICA STATUS SOLIDI, 1968, 26 (02) :469-&

[6]

AUTHIER A, 1977, CRYSTAL GROWTH MATER, P516

[7]

BADDUR A, 1973, SOV PHYS-CRYSTALLOGR, V17, P943

[8] GROWTH AND CHARACTERIZATION OF CS (D1-X,HX) 2 ASO4 FROM AQUEOUS-SOLUTIONS [J].

BALASCIO, JF ;

LOIACONO, GM ;

HAYDEN, SC ;

IDELSON, AL .

MATERIALS RESEARCH BULLETIN, 1975, 10 (03) :193-200

[9] SIMPLE CONSTANT-TEMPERATURE LABORATORY CRYSTALLIZER [J].

BARTLETT, BM .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1961, 38 (02) :54-&

[10] X-RAY TOPOGRAPHIC STUDY OF DISLOCATIONS IN KH2(1-X)D2XPO4 SINGLE-CRYSTALS [J].

BELOUET, C ;

MONNIER, M ;

DUNIA, E ;

PETROFF, JF .

MATERIALS RESEARCH BULLETIN, 1976, 11 (08) :903-910

← 1 2 3 4 5 6 7 8 9 10 →