THEORETICAL MODEL FOR ENERGY-DEPENDENCE OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY

被引：24

作者：

SANDSTROM, R

SPENCER, JF

HUMPHREYS, CJ

机构：

[1] ROY INST TECHNOL, DEPT THEORET PHYS, S-10044 STOCKHOLM 70, SWEDEN

[2] UNIV OXFORD, DEPT MET, PARKS RD, OXFORD, ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1974年 / 7卷 / 07期

关键词：

D O I：

10.1088/0022-3727/7/7/310

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1030 / 1046

页数：17

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