USE OF OPTICAL DENSITY MEASUREMENTS OF THIN FILMS TO DETERMINE VAPOR DISTRIBUTIONS

[1] A TRACER METHOD FOR THE THICKNESS MEASUREMENT OF THIN BI FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (08) : 424 - 426

[2] Holland L., 1952, VACUUM, V2, P346, DOI 10.1016/0042-207X(52)93784-6

[3] JENSEN N, 1956, J APPL PHYS, V27, P1460

[4] PREUSS LE, 1960, 7 NAT S VAC TECHN T, P260

[5] PREUSS LE, 1957, 4 NAT S VAC TECHN T, P47

[6] Tolansky S., 1948, MULTIPLE BEAM INTERF

[1] A TRACER METHOD FOR THE THICKNESS MEASUREMENT OF THIN BI FILMS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (08) : 424 - 426

[2] Holland L., 1952, VACUUM, V2, P346, DOI 10.1016/0042-207X(52)93784-6

[3] JENSEN N, 1956, J APPL PHYS, V27, P1460

[4] PREUSS LE, 1960, 7 NAT S VAC TECHN T, P260

[5] PREUSS LE, 1957, 4 NAT S VAC TECHN T, P47

[6] Tolansky S., 1948, MULTIPLE BEAM INTERF