THICKNESS DEPENDENCE OF THE PHASE-CONJUGATE SIGNAL OF AMORPHOUS SELENIUM THIN-FILMS

被引：4

作者：

HAROPONIATOWSKI, E ^{[1
]}

FERNANDEZGUASTI, M ^{[1
]}

CAMACHOLOPEZ, S ^{[1
]}

GILVILLEGAS, A ^{[1
]}

GONZALEZHERNANDEZ, J ^{[1
]}

机构：

[1] PROGRAMA MULTIDISCIPLINARIO MAT AVANZADOS,SALTILLO,COAHUILA 25000,MEXICO

来源：

OPTICS COMMUNICATIONS | 1995年 / 119卷 / 1-2期

关键词：

D O I：

10.1016/0030-4018(95)00251-3

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The dependence of the phase conjugate (PC) signal on the thickness of the nonlinear medium has been studied for amorphous selenium thin film samples, in the range from 1500 to 48000 Angstrom. The experiments were performed using a degenerate four wave mixing (DFWM) scheme. The PC signal increases with thickness of the sample in the 1500-15000 Angstrom range, for thicker samples the PC signal reaches a saturation value. The results are analyzed using a DFWM model in absorbing media. A novel theoretical treatment where the effect of reflection at the air-film interface plays a dominant role yields good agreement with the experimental data.

引用

页码：154 / 158

页数：5

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