HIGH-RESOLUTION SIDE-BAND HOLOGRAPHY WITH A STEM INSTRUMENT

被引：17

作者：

COWLEY, JM

机构：

[1] Department of Physics, Arizona State University, Tempe

来源：

ULTRAMICROSCOPY | 1990年 / 34卷 / 04期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(90)90023-F

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A scheme is proposed for use of a bi-prism in a STEM instrument so that two focused beams are formed at the specimen level. If one beam passes through a thin object and one beam passes in vacuum, interference fringes are produced in the diffraction plane from which reconstruction of the object transmission function can be made, digitally, with high resolution. The use of a second biprism in the post-specimen lens system is suggested as a means for overcoming some experimental difficulties.

引用

页码：293 / 297

页数：5