ELECTRON PROBE MICROANALYSIS

被引:37
作者
REUTER, W
机构
关键词
D O I
10.1016/0039-6028(71)90211-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:80 / &
相关论文
共 125 条
[81]  
PHILIBERT J, 1963, XRAY OPTICS MICROANA
[82]  
Philibert J., 1963, X RAY OPTICS XRAY MI, P451
[83]  
Philibert J., 1966, XRAY OPTICS MICROANA, P159
[84]  
POOLE DM, 1962, J I MET, V90, P228
[85]  
POOLE DM, 1969, METALS MATER, V3, P61
[86]  
POOLE DM, 1968, 298 NBS SPEC PUBL, P93
[87]   MEASUREMENT OF DIFFUSION LENGTHS IN P-TYPE GALLIUM ARSENIDE BY ELECTRON BEAM EXCITATION [J].
RAOSAHIB, TS ;
WITTRY, DB .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (09) :3745-&
[88]  
REDMOND G, 1970, 3 P ANN SCANN EL MIC, P33
[89]  
Reed S.J.B., 1963, X RAY OPTICS XRAY MI, P317
[90]   CHARACTERISTIC FLUORESCENCE CORRECTIONS IN ELECTRON-PROBE MICROANALYSIS [J].
REED, SJB .
BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (07) :913-&