DETERMINATION OF THE CRYSTALLOGRAPHIC POLARITY OF ZINCBLENDE STRUCTURE BY USING ION-INDUCED SECONDARY ELECTRONS

被引：10

作者：

KUDO, H

SHIMA, K

ISHIHARA, T

SEKI, S

机构：

[1] UNIV TSUKUBA, CTR TANDEM ACCELERATOR, TSUKUBA, IBARAKI 305, JAPAN

[2] ULVAC COATING CORP, KANAGAWA 253, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 11期

关键词：

Channeling; Crystallographic polarity; Secondary electrons;

D O I：

10.1143/JJAP.29.L2137

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

By using keV electron yields induced by 60-MeV S7+in GaP and inP crystal targets, we have carried out high sensitivity measurements of the preferential collision effect which is known to occur when the incident direction of the ions is slightly off from the axis of zincblende lattice. The results demonstrate the quick and simple determination of the crystallographic polarity of zincblende structure crystals using this method. © 1990 IOP Publishing Ltd.

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页码：L2137 / L2140

页数：4

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