RESONANT POWDER X-RAY-DIFFRACTION APPLIED TO MIXED-VALENCE COMPOUNDS AND THE POSSIBILITY OF SITE-RESOLVED X-RAY ABSORPTION-SPECTROSCOPY ILLUSTRATED FOR YBA2CU3O6.27

被引:22
作者
ATTFIELD, JP
机构
[1] Chemical Crystallography Laboratory, University of Oxford, Oxford, OX1 3PD
关键词
RESONANT SYNCHROTRON X-RAY POWDER DIFFRACTION; MIXED VALENCE COMPOUNDS; ANOMALOUS SCATTERING; X-RAY ABSORPTION SPECTROSCOPY; XANES;
D O I
10.1016/0022-3697(91)90199-A
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Synchrotron X-ray sources enable resonant diffraction experiments to be performed at energies very close to elemental absorption edges. This gives rise to very large anomalous scattering effects, which may differ significantly between different valence states of the resonant element. The relationships between the X-ray absorption spectrum and the anomalous scattering coefficients are described, and recent resonant powder diffraction studies of the mixed valence compounds EU3O4, Ga2Cl4, and YBa2Cu3O(x), and the valence fluctuations in alpha-Ce are reviewed. These results establish powder X-ray diffraction as a tool for studying electronic structure as well as the spatial electron distribution. Such experiments also give rise to the possibility of using resonant diffraction to determine site-resolved X-ray absorption spectra, and a simple method is outlined. This has been applied to polycrystalline YBa2Cu3O6.27 and the resolved K edge spectra for the two Cu sites are in qualitative agreement with other results for the valence distribution in this system.
引用
收藏
页码:1243 / 1249
页数:7
相关论文
共 29 条
[1]   A NEW APPROACH TO DETERMINING THE CHARGE-DISTRIBUTION IN COPPER-COMPOUNDS [J].
ALP, EE ;
GOODMAN, GL ;
SODERHOLM, L ;
MINI, SM ;
RAMANATHAN, M ;
SHENOY, GK ;
BOMMANNAVAR, AS .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (36) :6463-6468
[2]   DETERMINATION OF VALENCE AND CATION DISTRIBUTIONS BY RESONANT POWDER X-RAY-DIFFRACTION [J].
ATTFIELD, JP .
NATURE, 1990, 343 (6253) :46-49
[3]   DIRECT MEASUREMENTS OF THE COMPLEX-X-RAY ATOMIC SCATTERING FACTORS FOR ELEMENTS BY X-RAY INTERFEROMETRY AT THE DARESBURY SYNCHROTRON RADIATION SOURCE [J].
BEGUM, R ;
HART, M ;
LEA, KR ;
SIDDONS, DP .
ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 :456-464
[4]   ANGULAR-DEPENDENCE OF X-RAY ABSORPTION-SPECTRA [J].
BROUDER, C .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1990, 2 (03) :701-738
[6]   WHITE LINES IN X-RAY ABSORPTION [J].
BROWN, M ;
PEIERLS, RE ;
STERN, EA .
PHYSICAL REVIEW B, 1977, 15 (02) :738-744
[7]   RECENT ADVANCES IN THE CALCULATION AND MEASUREMENT OF THE X-RAY DISPERSION CORRECTIONS [J].
CREAGH, DC .
AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (03) :487-501
[8]   CALCULATION OF ANOMALOUS SCATTERING FACTORS AT ARBITRARY WAVELENGTHS [J].
CROMER, DT .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (AUG) :437-437
[9]   ON ENANTIOMORPH-POLARITY ESTIMATION [J].
FLACK, HD .
ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (NOV) :876-881
[10]   MEASUREMENT OF ANOMALOUS SCATTERING FACTORS NEAR GA K-ABSORPTION EDGE IN GAP [J].
FUKAMACHI, T ;
HOSOYA, S .
ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAR1) :215-220