Fourier analysis of X-ray patterns of vitreous SiO2 and B(2)O3

被引：434

作者：

Warren, BE ^{[1
]}

Krutter, H ^{[1
]}

Morningstar, O ^{[1
]}

机构：

[1] Massachusetts Inst Technol, Dept Phys, Cambridge, MA USA

来源：

关键词：

D O I：

10.1111/j.1151-2916.1936.tb19822.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：202 / 206

页数：5

共 11 条

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COMPTON AH, 1935, XRAYS THEORY EXPT, P781

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Warren, BE ;

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Zachariasen WH, 1934, Z KRISTALLOGR, V88, P150

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[9]

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[10]

ZACHARIASEN WH, 1934, CERAM ABS, V13, P242