THE INFLUENCE OF THE GENERATION VOLUME OF MINORITY-CARRIERS ON EBIC

[1] THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE [J]. SOLID-STATE ELECTRONICS, 1976, 19 (06) : 437 - 445

[2] BRESSE JF, 1972, SCANNING ELECTRON MI, P105

[3] CHI JY, 1977, IEEE T ELECTRON DEV, V24, P1366

[4] RESPONSE OF SI AND GAP P-N JUNCTIONS TO A 5- TO 40-KEV ELECTRON BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (11) : 4236 - &

[5] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5837 - &

[6] APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (10) : 537 - 539

[7] PENETRATION AND ENERGY-LOSS THEORY OF ELECTRONS IN SOLID TARGETS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (01) : 43 - &

[8] SHEA SP, 1978, SCANNING ELECTRON MI, V1, P435

[9] VANOPDORP C, 1977, PHILIPS RES REP, V32, P192

[10] von Roos O., 1978, Solid-State Electronics, V21, P1063, DOI 10.1016/0038-1101(78)90186-7

[1] THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE [J]. SOLID-STATE ELECTRONICS, 1976, 19 (06) : 437 - 445

[2] BRESSE JF, 1972, SCANNING ELECTRON MI, P105

[3] CHI JY, 1977, IEEE T ELECTRON DEV, V24, P1366

[4] RESPONSE OF SI AND GAP P-N JUNCTIONS TO A 5- TO 40-KEV ELECTRON BEAM [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (11) : 4236 - &

[5] DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (13) : 5837 - &

[6] APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS [J]. APPLIED PHYSICS LETTERS, 1975, 27 (10) : 537 - 539

[7] PENETRATION AND ENERGY-LOSS THEORY OF ELECTRONS IN SOLID TARGETS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (01) : 43 - &

[8] SHEA SP, 1978, SCANNING ELECTRON MI, V1, P435

[9] VANOPDORP C, 1977, PHILIPS RES REP, V32, P192

[10] von Roos O., 1978, Solid-State Electronics, V21, P1063, DOI 10.1016/0038-1101(78)90186-7