METAL-SEMICONDUCTOR BARRIER-HEIGHT MEASUREMENT BY DIFFERENTIAL CAPACITANCE METHOD-DEGENERATE 1-CARRIER SYSTEM

被引：17

作者：

GOODMAN, AM

PERKINS, DM

机构：

来源：

关键词：

D O I：

10.1063/1.1713221

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3351 / &

共 12 条

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