A LIGHT DIFFRACTION TECHNIQUE FOR MEASURING DIELECTRIC CONSTANTS AT MICROWAVE FREQUENCIES

被引：2

作者：

AUTH, DC

MAYER, WG

THALER, WJ

机构：

[1] Dept. of Physics Georgetown University, Washington, D.C.

来源：

PROCEEDINGS OF THE IEEE | 1969年 / 57卷 / 01期

关键词：

D O I：

10.1109/PROC.1969.6888

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Light diffraction from spatially periodic temperature variations in a transparent solid is reported. Local microwave beating at the antinodes of a standing wave difracts light; this a determination of dielectric constant by measurement of the microwave phase velocity is possible. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：96 / &