SURFACE RESISTANCE OF EPITAXIAL AND POLYCRYSTALLINE NbCN FILMS IN SUBMILLIMETER WAVE REGION

被引:22
作者
Kohjiro, S. [1 ]
Kiryu, S. [1 ]
Shoji, A. [1 ]
机构
[1] Electrotech Lab, 1-1-4 Umezono, Tsukuba, Ibaraki 305, Japan
关键词
D O I
10.1109/77.233592
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Surface resistances, R-s, of epitaxial and polycrystalline NbCN films in submillimeter wave region were evaluated from measurements of Fiske-resonant modes in Josephson tunnel junctions. It is found that epitaxial NbCN films have about one order of magnitude smaller R-s values than those for polycrystalline NbCN films. It is also found that the frequency dependence of R-s of epitaxial and polycrystalline NbCN films can be explained by the two-fluid model.
引用
收藏
页码:1765 / 1767
页数:3
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