QUANTITATIVE CHARACTERIZATION OF RAMAN-SPECTRA OF VANADIUM-OXIDES LAYERED ON SIO2

被引:30
作者
MIYATA, H
TOKUDA, S
YOSHIDA, T
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D O I
10.1366/0003702894203039
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:522 / 526
页数:5
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