NEW DETERMINATION OF PARTIAL SUBSHELL PHOTO-IONIZATION CROSS-SECTIONS IN ARGON AND XENON

被引：23

作者：

ADAM, MY

WUILLEUMIER, F

SANDNER, N

KRUMMACHER, S

SCHMIDT, V

MEHLHORN, W

机构：

[1] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE

[2] UNIV FREIBURG,FAC PHYS,D-7800 FREIBURG,FED REP GER

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1978年 / 17卷

关键词：

D O I：

10.7567/JJAPS.17S2.170

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：170 / 173

页数：4

共 29 条

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[2]

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[3]

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[5]

AMUSIA MY, 1974, 4TH P INT C VUV RAD, P205

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[7] DOUBLE ELECTRON EJECTION RESULTING FROM PHOTO-IONIZATION IN OUTER-MOST SHELL OF HE NE AND AR AND ITS RELATIONSHIP TO ELECTRON CORRELATION [J].

CARLSON, TA .

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[8]

CHANG TS, UNPUBLISHED

[9] ANGULAR-DISTRIBUTION AND PHOTOIONIZATION MEASUREMENTS ON 2P-ELECTRON AND 2S-ELECTRON IN NEON [J].

CODLING, K ;

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WOODRUFF, PR .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1976, 9 (05) :L83-L86

[10] ANGULAR-DISTRIBUTION AND PHOTOIONIZATION CROSS-SECTION MEASUREMENTS ON 3P AND 3S SUBSHELLS OF ARGON [J].

HOULGATE, RG ;

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MARR, GV .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1974, 7 (17) :L470-L473

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