SUITABILITY OF TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR ELEMENTAL SPECIATION STUDIES

被引：5

作者：

MUKHTAR, S ^{[1
]}

HASWELL, SJ ^{[1
]}

机构：

[1] UNIV HULL,SCH CHEM,HULL HU6 7RX,N HUMBERSIDE,ENGLAND

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1991年 / 6卷 / 04期

关键词：

X-RAY FLUORESCENCE; ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY; TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY; SPECIATION;

D O I：

10.1039/ja9910600339

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Total reflection X-ray fluorescence spectrometry (TXRF) has been shown to be applicable when determining different oxidation states in a variety of compounds by the method of K-beta/K-alpha intensity ratioing. It has also been shown that by using TXRF it is possible to relate shifts in the intensity ratio to coordination bonding.

引用

页码：339 / 341

页数：3

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