PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS

被引:115
作者
BENNETT, HE
KOEHLER, WF
机构
关键词
D O I
10.1364/JOSA.50.000001
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1 / 6
页数:6
相关论文
共 15 条
[1]  
BEATTIE JR, 1955, PHILOS MAG, V46, P235
[2]  
DOWNIE, 1953, J OPT SOC AM, V43, P941
[3]  
GATES, 1958, J OPT SOC AM, V48, P88
[4]  
GIER, 1954, J OPT SOC AM, V44, P558
[5]  
JOHN S, 1938, PROCEDURES EXPT PHYS, P376
[8]   REFLECTIVITY OF THIN SILVER FILMS AND THEIR USE IN INTERFEROMETRY [J].
KUHN, H ;
WILSON, BA .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1950, 63 (370) :745-755
[9]  
PACKER DM, 1945, J OPT SOC AM, V35, P806
[10]  
PLYLER, 1957, J RES NBS, V58, P195