INTERFACES BETWEEN ALUMINA AND PLATINUM - STRUCTURE, BONDING AND FRACTURE-RESISTANCE

被引：32

作者：

DEGRAEF, M ^{[1
]}

DALGLEISH, BJ ^{[1
]}

TURNER, MR ^{[1
]}

EVANS, AG ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY, DEPT MAT & MINERAL ENGN, BERKELEY, CA 94710 USA

来源：

ACTA METALLURGICA ET MATERIALIA | 1992年 / 40卷

关键词：

D O I：

10.1016/0956-7151(92)90292-M

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Various diffusion bonded interfaces have been produced between Pt and either sapphire or polycrystalline Al2O3. The structure, bonding and fracture resistance of these interfaces have been examined, as well as the infuence of intervening silicate phases, both amorphous and crystalline. It is found that the intrinsic fracture resistance GAMMA(i) of the Pt/sapphire interface is high, especially when Pt has an epitaxial orientation with respect to the sapphire. The fracture resistance is substantially degraded by amorphous silicate phases at the interface, even when discontinuous, but is not adversely influenced by crystalline silicates. By contrast, the silicate phase enhances the diffusion bonding and facilitates formation of void-free bonds. This duality in the role of silicates is a major feature of this article.

引用

页码：S333 / S344

页数：12

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