RELATIONSHIPS BETWEEN PROCESSING TEMPERATURE AND MICROSTRUCTURE IN ISOTHERMAL MELT-PROCESSED BI-2212 THICK-FILMS

被引：3

作者：

HOLESINGER, TG

PHILLIPS, DS

WILLIS, JO

PETERSON, DE

机构：

[1] Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

基金：

美国能源部;

关键词：

D O I：

10.1109/77.402963

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The microstructure ar 1 phase assemblage of isothermal meltprocessed (IMP) Bi2Sr2CaCu2Oy (Bi-2212) thick films have been evaluated. Results from compositional analysis and phase identification indicate that the characteristics of the partial melt greatly influence the microstructural and chemical development of the thick films. The highest critical current densities were obtained in films processed below 800 degrees C where the partial melt uniformly coats the substrate without excessive phase segregation.

引用

页码：1939 / 1942

页数：4

共 10 条

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