POLYSTYRENE LATEX-PARTICLES AS A SIZE CALIBRATION FOR THE ATOMIC FORCE MICROSCOPE

被引：78

作者：

LI, Y

LINDSAY, SM

机构：

[1] Department of Physics, Arizona State University, Tempe

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 11期

关键词：

D O I：

10.1063/1.1142243

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A simple method for spreading polystyrene-latex spheres onto mica substrates to form highly crystalline layers is described. These layers can be used as a simple calibration standard for the atomic force microscope in the nanometer to micron size range. In particular, they provide simultaneous x, y, and z calibration. The concentration of particles of about 0.01% is found to be good for forming ordered structures. Two-dimensional polycrystalline structures of polytstyrene spheres with different packing orders (cubic and hexagonal close-pack) and some defects (vacancies, dislocations, and grain boundaries) were observed.

引用

页码：2630 / 2633

页数：4