学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
INTEGRATED SILICON ANEMOMETER
被引:114
作者
:
VANPUTTE.AF
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
VANPUTTE.AF
[
1
]
MIDDELHOEK, S
论文数:
0
引用数:
0
h-index:
0
机构:
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
MIDDELHOEK, S
[
1
]
机构
:
[1]
DELFT UNIV TECHNOL, DEPT ELECT ENGN, ELECT MAT LAB, MEKELWEG 4, DELFT, NETHERLANDS
来源
:
ELECTRONICS LETTERS
|
1974年
/ 10卷
/ 21期
关键词
:
D O I
:
10.1049/el:19740339
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:425 / 426
页数:2
相关论文
共 2 条
[1]
HUTTON SP, 1971, P C MODERN DEVELOPME, P401
[2]
FLOW ANGLE AND SHEAR-STRESS MEASUREMENTS USING HEATED FILMS AND WIRES
MCCROSKEY, WJ
论文数:
0
引用数:
0
h-index:
0
MCCROSKEY, WJ
DURBIN, EJ
论文数:
0
引用数:
0
h-index:
0
DURBIN, EJ
[J].
JOURNAL OF BASIC ENGINEERING,
1972,
94
(01):
: 46
-
+
←
1
→
共 2 条
[1]
HUTTON SP, 1971, P C MODERN DEVELOPME, P401
[2]
FLOW ANGLE AND SHEAR-STRESS MEASUREMENTS USING HEATED FILMS AND WIRES
MCCROSKEY, WJ
论文数:
0
引用数:
0
h-index:
0
MCCROSKEY, WJ
DURBIN, EJ
论文数:
0
引用数:
0
h-index:
0
DURBIN, EJ
[J].
JOURNAL OF BASIC ENGINEERING,
1972,
94
(01):
: 46
-
+
←
1
→