CHARACTERISTICS OF AN ULTRA-HIGH RESOLUTION GE(LI) SPECTROMETER FOR SINGLES AND COINCIDENCE X-RAY AND GAMMA-RAY STUDIES

The use of an ultra-high resolution Ge(Li) photon spectrometer in low and high energy X-ray and gamma-ray measurements has been evaluated. Studies were made of the resolution, low energy cutoff, the full energy and K X-ray escape effi ciencies, the effective detector dead layer and the detector linearity. The detector was used simultaneously with a high resolution Si(Li) detector to measure fast coincidences between Kα1 Kα2and L X-rays, as well as coincidences between K, L conversion electrons and X-rays. A detailed discussion is presented of the electronic problems associated with making these kind of measurements. Measurements were also made of X-ray beams produced by clinical X-ray machines at 40, 78 and 220 kV. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.