INTERNAL-STRESS IN ALUMINUM-OXIDE, TITANIUM CARBIDE AND COPPER-FILMS OBTAINED BY PLANAR MAGNETRON SPUTTERING

被引:25
作者
KUWAHARA, K
SUMOMOGI, T
KONDO, M
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D O I
10.1016/0040-6090(81)90416-8
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T [工业技术];
学科分类号
08 ;
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页码:41 / 47
页数:7
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共 17 条
[1]  
FINEGAN JD, 1961, AEC15 CAS I TECHN TE
[2]   DETERMINATION OF STRESS IN FILMS ON SINGLE CRYSTALLINE SILICON SUBSTRATES [J].
GLANG, R ;
HOLMWOOD, RA ;
ROSENFELD, RL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (01) :7-+
[3]   COMPRESSIVE STRESS TRANSITION IN AL, V, ZR, NB AND W METAL-FILMS SPUTTERED AT LOW WORKING PRESSURES [J].
HOFFMAN, DW ;
THORNTON, JA .
THIN SOLID FILMS, 1977, 45 (02) :387-396
[4]  
Hoffman R. W., 1966, PHYS THIN FILMS, VVol. 3, pp. 211
[5]   CHARACTERISTICS OF ION-BEAM-SPUTTERED THIN-FILMS [J].
KANE, SM ;
AHN, KY .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :171-174
[6]   STRESS IN VACUUM DEPOSITED FILMS OF SILVER [J].
KINOSITA, K ;
MAKI, K ;
NAKAMIZO, K ;
TAKEUCHI, K .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1967, 6 (01) :42-+
[7]   AN APPARATUS FOR MEASURING STRESS IN THIN FILMS [J].
KLOKHOLM, E .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (08) :1054-+
[8]  
Lee C. C., 1970, PROGR PHYS ORG CHEM, V7, P129
[9]   STRESS IN VACUUM-DEPOSITED FILMS OF AG, AU, AND CU [J].
MAKI, K ;
NAKAJIMA, Y ;
KINOSITA, K .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04) :622-&
[10]   STRESSES IN SPUTTER-DEPOSITED NICKEL AND COPPER-OXIDE THIN-FILMS [J].
PLUNKETT, PV ;
JOHNSON, RM ;
WISEMAN, CD .
THIN SOLID FILMS, 1979, 64 (01) :121-128