STEREOGRAPHIC TECHNIQUE FOR QUANTITATIVE-ANALYSIS FOR CLEAVAGE PLANE ORIENTATION

A stereoscopic method for use with x-ray energy dispersive spectroscopy of rough surfaces was adapted and applied to the fracture surface of a nickel alloy single crystal to permit rapid orientation determinations of small cleavage planes. The method uses a mathematical treatment of stereo pair photomicrographs to measure the angle between the electron beam and the surface normal. One reference crystal orientation corresponding to the electron beam direction (crystal growth direction) is required to perform this trace analysis. An area as small as 10-mu-m can be analyzed. The sensitivity of this technique was evaluated using a specimen with known orientation.