ON THE LOW-FREQUENCY MODES IN THE SURFACE ENHANCED RAMAN-SPECTRA OF PYRIDINE ADSORBED ON CU, AG AND AU ELECTRODES

被引:30
作者
LOO, BH
机构
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1982年 / 131卷 / JAN期
关键词
D O I
10.1016/0022-0728(82)87091-5
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:381 / 385
页数:5
相关论文
共 25 条
[1]   ANOMALOUSLY INTENSE RAMAN-SPECTRA OF PYRIDINE AT A SILVER ELECTRODE [J].
ALBRECHT, MG ;
CREIGHTON, JA .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1977, 99 (15) :5215-5217
[2]   RAMAN SPECTRAL STUDIES AT THE SILVER SURFACE OF THE AG-KCL, PYRIDINE ELECTRODE [J].
ATKINSON, GF ;
GUZONAS, DA ;
IRISH, DE .
CHEMICAL PHYSICS LETTERS, 1980, 75 (03) :557-560
[3]   ENHANCED RAMAN EFFECT FROM CYANIDE ADSORBED ON A SILVER ELECTRODE [J].
BILLMANN, J ;
KOVACS, G ;
OTTO, A .
SURFACE SCIENCE, 1980, 92 (01) :153-173
[4]  
Burstein E., 1979, Light scattering in solids, P479
[5]   DEPENDENCE OF INTENSITY OF RAMAN BANDS OF PYRIDINE AT A SILVER ELECTRODE ON WAVELENGTH OF EXCITATION [J].
CREIGHTON, JA ;
ALBRECHT, MG ;
HESTER, RE ;
MATTHEW, JAD .
CHEMICAL PHYSICS LETTERS, 1978, 55 (01) :55-58
[6]   COMMENTS ON THE 210-243 CM-1 MODE IN SURFACE ENHANCED RAMAN-SCATTERING FROM THE PYRIDINE-AG SYSTEM [J].
DORNHAUS, R ;
CHANG, RK .
SOLID STATE COMMUNICATIONS, 1980, 34 (10) :811-815
[7]   PHYSICAL AND CHEMICAL CHARACTERIZATION OF ELECTROCHEMICALLY REFORMED SILVER SURFACES [J].
EVANS, JF ;
ALBRECHT, MG ;
ULLEVIG, DM ;
HEXTER, RM .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1980, 106 (1-2) :209-234
[8]   RAMAN-SPECTRA OF PYRIDINE ADSORBED AT A SILVER ELECTRODE [J].
FLEISCHMANN, M ;
HENDRA, PJ ;
MCQUILLAN, AJ .
CHEMICAL PHYSICS LETTERS, 1974, 26 (02) :163-166
[9]   ENHANCED RAMAN-SPECTRA FROM SPECIES FORMED BY THE COADSORPTION OF HALIDE-IONS AND WATER-MOLECULES ON SILVER ELECTRODES [J].
FLEISCHMANN, M ;
HENDRA, PJ ;
HILL, IR ;
PEMBLE, ME .
JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1981, 117 (02) :243-255
[10]   A CRITICAL ANALYSIS OF THEORETICAL-MODELS FOR THE GIANT RAMAN EFFECT FROM ADSORBED MOLECULES [J].
FURTAK, TE ;
REYES, J .
SURFACE SCIENCE, 1980, 93 (2-3) :351-382