ASAXS FROM CDSXSE1-X-DOPED SILICATE-GLASSES

被引:8
作者
GOERIGK, G [1 ]
HAUBOLD, HG [1 ]
KLINGSHIRN, C [1 ]
UHRIG, A [1 ]
机构
[1] UNIV KAISERSLAUTERN,D-67663 KAISERSLAUTERN,GERMANY
关键词
D O I
10.1107/S0021889894004899
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Anomalous small-angle X-ray scattering (ASAXS) was employed to analyze CdSxSe1-x-doped silicate glasses, x = 0.4 and 0.6. From the intensity variations, as measured for four X-ray energies near the K-absorption edge of Se and at 9.5 keV, reliable values for the ratio of molecular densities in the crystalline CdSxSe1-x phase and the surrounding amorphous matrix were found. Combination of this with the integrated intensity yields values for the CdSxSe1-x volume fraction of 0.7 to 3%. Mean particle radii between 5 and 7 nm and number densities in the range 1 to 8 x 10(16) cm(-3) were obtained from fitted Gaussian and log-normal size distributions, respectively.
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收藏
页码:907 / 911
页数:5
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