FOURIER ANALYSIS OF X-RAY DIFFRACTION PROFILES OBTAINED FROM TANTALUM FILINGS

被引：18

作者：

SCHOENING, FRL

机构：

来源：

ACTA METALLURGICA | 1956年 / 4卷 / 05期

关键词：

D O I：

10.1016/0001-6160(56)90047-5

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：510 / 513

页数：4

共 6 条

[1] TENSILE PROPERTIES OF ANNEALED TANTALUM AT LOW TEMPERATURES [J].

BECHTOLD, JH .

ACTA METALLURGICA, 1955, 3 (03) :249-254

[2]

Hagg G, 1931, Z PHYS CHEM B-CHEM E, V11, P433

HORN, FH ;

ZIEGLER, WT .

[4] X-RAY REFLEXIONS FROM DILUTE SOLID SOLUTIONS [J].

HUANG, K .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1947, 190 (1020) :102-117

[5] THE EFFECT OF COLD-WORK DISTORTION ON X-RAY PATTERNS [J].

WARREN, BE ;

AVERBACH, BL .

[6] A GENERALIZED TREATMENT OF COLD WORK IN POWDER PATTERNS [J].

WARREN, BE .