DIRECT PHOTOELECTRIC MEASUREMENT OF INTERFACE-STATE DENSITY AT A PT-SI INTERFACE

被引：21

作者：

DENEUVIL.A

CHAKRAVE.BK

机构：

来源：

PHYSICAL REVIEW LETTERS | 1972年 / 28卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.28.1258

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1258 / +

页数：1

共 15 条

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