USE OF THE THERMAL LENS EFFECT AT TC = 855K IN BA2NANB5O15 TO MEASURE ORDER PARAMETER EVOLUTION

被引:6
作者
SCOTT, JF
SHEIH, SJ
CHEN, T
机构
[1] Department of Physics, University of Colorado, Boulder
基金
美国国家科学基金会;
关键词
D O I
10.1080/00150199108222400
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
By measuring the beam divergence Ѳ(T) as a function of temperature in the recently discovered thermal lens effect in ferroelectrics (J. F. Scott et al., Phys. Rev. B, in press, 1989), we have been able to determine preliminary values of the critical exponent ß. We find that 2B= 0.50 + 0.05 in agreement with mean field predictions. We also find an unexpected deviation from mean field within ~ 5K of T~. This is probably due to defect mechanisms and agrees quantitatively with birefringence results elsewhere (E. Salje, U. Bismayer, and M. Jansen, J. Phys. C20, 3613 (1987); I. G. Wood and A. M. Glazer, J. Appl. Cryst. 13, 217 (1980)). © 1991, Taylor & Francis Group, LLC. All rights reserved.
引用
收藏
页码:21 / 25
页数:5
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