VALUES OF K-SHELL PARTIAL CROSS-SECTION FOR ELECTRON ENERGY-LOSS SPECTROMETRY

被引:14
作者
EGERTON, RF
机构
来源
JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 123卷 / SEP期
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D O I
10.1111/j.1365-2818.1981.tb02479.x
中图分类号
TH742 [显微镜];
学科分类号
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页码:333 / 337
页数:5
相关论文
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