HIGH-RESOLUTION ELECTRON-MICROSCOPY OF GRAPHITE DEFECT STRUCTURES AFTER KEV HYDROGEN-ION BOMBARDMENT

被引：31

作者：

GOTOH, Y ^{[1
]}

SHIMIZU, H ^{[1
]}

MURAKAMI, H ^{[1
]}

机构：

[1] ELECTROTECH LAB,TSUKUBA,IBARAKI 305,JAPAN

来源：

关键词：

D O I：

10.1016/0022-3115(89)90373-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：851 / 855

页数：5

共 23 条

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