DETERMINATION OF THE SEPARATION BETWEEN THE SOFT-X-RAY K-EMISSION AND K-ABSORPTION EDGES IN BERYLLIUM METAL FROM SELF-ABSORPTION STUDIES

被引：3

作者：

CRISP, RS

机构：

[1] University of Western Australia, Nedlands

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1979年 / 15卷 / JAN期

关键词：

D O I：

10.1016/0368-2048(79)87009-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Recent theoretical studies have aroused interest in the phonon broadening of the soft x-ray emission and absorption edges and the shift between them. Using a self-absorption technique a separation of about 0.2 eV is shown to exist between the edges in Be metal. This shift explains the very small self-absorption effects previously observed in Be by Crisp (Ref. 1). © 1979.

引用

页码：43 / 44

页数：2

共 6 条

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