PRECISE DETERMINATION OF HIGH METALLIC REFLECTION IN THE FAR-INFRARED - THE REFLECTION-FABRY-PEROT

被引：9

作者：

GENZEL, L

BARTH, KL

KEILMANN, F

机构：

[1] Max-Planck-Institut für Festkörperforschung, 7000

来源：

INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 1990年 / 11卷 / 09期

关键词：

07.60.Ly; 42.80.Jr;

D O I：

10.1007/BF01008573

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate in theory and experiment the use of a reflective Fabry-Perot interferometer to precisely determine the far-infrared reflectance of smooth metal surfaces. The absorption loss in the metal is amplified and thus conveniently measured on resonance whereas the 100% reflectance reference is taken off resonance. Absolute accuracy of ±0.1% is achievable. © 1990 Plenum Publishing Corporation.

引用

页码：1133 / 1161

页数：29

共 8 条

[1]

BAUER M, 1990, THESIS M PLANCK I FE

[2] ABSOLUTE MEASUREMENT OF FAR-INFRARED SURFACE RESISTANCE OF PB [J].

BRANDLI, G ;

SIEVERS, AJ .

PHYSICAL REVIEW B-SOLID STATE, 1972, 5 (09) :3550-+

[3]

Douglas N.G., 1989, SPRINGER SERIES OPTI, V61

[4]

Grosse P., 1979, FREIE ELEKTRONEN FES

[5]

Keilmann Fritz, 1986, SPIE, V666, P213

[6] USE OF A FABRY-PEROT RESONATOR FOR THE MEASUREMENT OF THE SURFACE-RESISTANCE OF HIGH-TC SUPERCONDUCTORS AT MILLIMETER WAVE FREQUENCIES [J].

KESSLER, JR ;

GERING, JM ;

COLEMAN, PD .

INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1990, 11 (02) :151-164

[7] INTERFERENCE FILTERS AND FABRY-PEROT INTERFEROMETERS FOR THE FAR INFRARED [J].

RENK, KF ;

GENZEL, L .

APPLIED OPTICS, 1962, 1 (05) :643-648

[8]

SAKAI K, 1983, REV INFRARED MILLIME, V1, P155

← 1 →