REFRACTIVE-INDEX DETERMINATION USING REFLECTANCE EXTREMA

[1] ABELES F, 1963, PROGR OPTICS, V2, P254

[2] HEAVENS OS, 1964, PHYSICS THIN FILMS, V2, P213

[3] HETRICK RE, 1975, PHYS REV B, V11, P1273, DOI 10.1103/PhysRevB.11.1273

[4] HORWITZ CM, UNPUBLISHED

[5] THEORETICAL DETERMINATION OF OPTICAL-CONSTANTS OF WEAKLY ABSORBING THIN-FILMS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (11) : 1588 - &

[6] Macleod H., 2018, THIN FILM OPTICAL FI, V5th ed.

[7] MATTOX DM, 1975, J VAC SCI TECHNOL, V12, P1022

[8] DERIVATION OF OPTICAL-CONSTANTS OF METALS FROM THIN-FILM MEASUREMENTS AT OBLIQUE-INCIDENCE [J]. APPLIED OPTICS, 1972, 11 (03): : 643 - &

[9] ROUARD P, 1965, PROGRESS OPTICS, V4, P145

[1] ABELES F, 1963, PROGR OPTICS, V2, P254

[2] HEAVENS OS, 1964, PHYSICS THIN FILMS, V2, P213

[3] HETRICK RE, 1975, PHYS REV B, V11, P1273, DOI 10.1103/PhysRevB.11.1273

[4] HORWITZ CM, UNPUBLISHED

[5] THEORETICAL DETERMINATION OF OPTICAL-CONSTANTS OF WEAKLY ABSORBING THIN-FILMS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (11) : 1588 - &

[6] Macleod H., 2018, THIN FILM OPTICAL FI, V5th ed.

[7] MATTOX DM, 1975, J VAC SCI TECHNOL, V12, P1022

[8] DERIVATION OF OPTICAL-CONSTANTS OF METALS FROM THIN-FILM MEASUREMENTS AT OBLIQUE-INCIDENCE [J]. APPLIED OPTICS, 1972, 11 (03): : 643 - &

[9] ROUARD P, 1965, PROGRESS OPTICS, V4, P145