SOME APPLICATIONS OF THIN FILMS TO POLARIZATION DEVICES

被引:44
作者
CLAPHAM, PB
DOWNS, MJ
KING, RJ
机构
[1] The Division of Optical Metrology, Teddington
[2] National Physical Laboratory, Teddington
来源
APPLIED OPTICS | 1969年 / 8卷 / 10期
关键词
D O I
10.1364/AO.8.001965
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In the first application of thin films discussed, a multilayer stack is enclosed in a cemented cube to form a polarizing beam splitter. Polarizing efficiencies exceeding 99.8% have been achieved in both reflected and transmitted beams at the design wavelength. In the second application, the deposition of thin films on the totally reflecting surfaces of silica phase retarding systems has resulted in a substantial improvement in achromatism of these devices. Measured phase retardations of one of the two devices described were within 0.5° of 90° over the visible and uv to wavelengths down to 200 nm. © 1969 Optical Society of America.
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页码:1965 / &
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