BONDING AT THE K/SI(100) 2X1 INTERFACE - A SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY

被引：108

作者：

KENDELEWICZ, T

SOUKIASSIAN, P

LIST, RS

WOICIK, JC

PIANETTA, P

LINDAU, I

SPICER, WE

机构：

[1] NO ILLINOIS UNIV,DEPT PHYS,DE KALB,IL 60115

[2] UNIV WISCONSIN,CTR SYNCHROTRON RADIAT,STOUGHTON,WI 53589

[3] STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305

来源：

PHYSICAL REVIEW B | 1988年 / 37卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.37.7115

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：7115 / 7117

页数：3

共 19 条

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[J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1986, 318 (1541): : 203 - 217
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[10] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL
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[J]. REVIEWS OF MODERN PHYSICS, 1981, 53 (04) : 769 - 806

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