LASER SIMULATION OF SINGLE EVENT UPSETS

被引：49

作者：

BUCHNER, SP

WILSON, D

KANG, K

GILL, D

MAZER, JA

RABURN, WD

CAMPBELL, AB

KNUDSON, AR

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

[2] MARTIN MARIETTA ORLANDO AEROSP,ORLANDO,FL 32855

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1987年 / 34卷 / 06期

关键词：

D O I：

10.1109/TNS.1987.4337457

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1228 / 1233

页数：6

共 7 条

[1] SINGLE EVENT ERROR IMMUNE CMOS RAM [J].

ANDREWS, JL ;

SCHROEDER, JE ;

GINGERICH, BL ;

KOLASINSKI, WA ;

KOGA, R ;

DIEHL, SE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2040-2043

[2] USE OF CF-252 TO DETERMINE PARAMETERS FOR SEU RATE CALCULATION [J].

BLANDFORD, JT ;

PICKEL, JC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4282-4286

[3] ERROR ANALYSIS AND PREVENTION OF COSMIC ION-INDUCED SOFT ERRORS IN STATIC CMOS RAMS [J].

DIEHL, SE ;

OCHOA, A ;

DRESSENDORFER, PV ;

KOGA, R ;

KOLASINSKI, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2032-2039

[4] USE OF AN ION MICROBEAM TO STUDY SINGLE EVENT UPSETS IN MICROCIRCUITS [J].

KNUDSON, AR ;

CAMPBELL, AB .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4017-4021

[5]

MCLEAN FB, 1982, IEEE T NUCL SCI, V29, P2018

[6]

PHILIPP HR, 1962, PHYS REV LETT, V8, P13

[7]

RABURN WD, 1987, IN PRESS JAN NAT SPA

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