I(DD) PULSE RESPONSE TESTING - A UNIFIED APPROACH TO TESTING DIGITAL AND ANALOG ICS

被引：11

作者：

BEASLEY, J

RAMAMURTHY, H

RAMIREZAUGULO, J

DEYONG, M

机构：

[1] Department of Electrical and Computer Engineering, New Mexico State University, Las Cruces

来源：

ELECTRONICS LETTERS | 1993年 / 29卷 / 24期

关键词：

INTEGRATED CIRCUITS; CIRCUIT TESTING;

D O I：

10.1049/el:19931405

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A test method is presented for detecting defects and fabrication variations in both digital and analogue circuits by simultaneously pulsing the power supply rails and analysing the temporal and/or the spectral characteristics of the resulting transient rail currents. The presented method has a distinct advantage over other forms of i(DD) testing because it requires a single test vector to excite and expose the presence of a defect or fabrication variations.

引用

页码：2101 / 2103

页数：3

共 7 条

[1]

Hawkins C. F., 1985, International Test Conference 1985 Proceedings. The Future of Test (Cat. No.85CH2230-1), P544

[2]

Horning L. K., 1987, International Test Conference 1987 Proceedings: Integration of Test with Design and Manufacturing (Cat. No.87CH2347-2), P300

[3]

LEVI MW, 1981, INT TEST C, P217

[4]

Maly W., 1988, P INT C COMPUTER AID, P340

[5] DESIGN TECHNIQUES FOR CASCODED CMOS OP AMPS WITH IMPROVED PSRR AND COMMON-MODE INPUT RANGE [J].

RIBNER, DB ;

COPELAND, MA .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1984, 19 (06) :919-925

[6]

Soden J. M., 1989, International Test Conference 1989. Proceedings. Meeting the Tests of Time (Cat. No.89CH2742-5), P423, DOI 10.1109/TEST.1989.82325

[7]

SYRZCKI M, 1988, CMUCAD8822 CARN MELL

← 1 →