A new type of preamplifier is described that promises a significant improvement in the energy resolution of semiconductor detector spectrometers. While other applications of the principles are anticipated, this paper deals only with their use for X-ray fluorescence spectroscopy. We have achieved a total electronic contribution to the resolution of about 150 eV (fwhm-silicon) with further small improvements considered likely in the near future. This includes the detector leakage noise contribution. A conventional system using components of the same inherent quality exhibits a resolution of nearly 300 eV. © 1969.
