SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION

被引：55

作者：

FLOCCHINI, RG

FEENEY, PJ

SOMMERVILLE, RJ

CAHILL, TA

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1972年 / 100卷 / 03期

关键词：

D O I：

10.1016/0029-554X(72)90813-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：397 / +

页数：1

共 11 条

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[3] GOULDING FS, 1971, UCRL20625
[4] JAKLEVIC JM, 1970, UCRL20152
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AKSELSSON, R
JOHANSSON, SA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +
[6] PRECISE TEST OF Z2 DEPENDENCE OF X-RAY EMISSION INDUCED BY ALPHA PARTICLES AND DEUTERONS
LEWIS, CW
NATOWITZ, JB
WATSON, RL
[J]. PHYSICAL REVIEW LETTERS, 1971, 26 (09) : 481 - &
[7] MARION JB, 1968, NUCLEAR REACTION ANA, P136
[8] MUELLER PK, 1971, MAR AM CHEM SOC M LO
[9] RUDOLPH H, 1971, B AM PHYS SOC, V16, P545
[10] X-RAY EMISSION INDUCED BY 30 TO 80 MEV ALPHA PARTICLES
WATSON, RL
LEWIS, CW
NATOWITZ, JB
[J]. NUCLEAR PHYSICS A, 1970, A154 (03) : 561 - &