CHARACTERIZATION OF POLYPHASIC SILICON-CARBIDE USING SURFACE-ENHANCED RAMAN AND NUCLEAR-MAGNETIC-RESONANCE SPECTROSCOPY

被引：29

作者：

DANDO, NR ^{[1
]}

TADAYYONI, MA ^{[1
]}

机构：

[1] LONG ISL UNIV,DEPT CHEM,BROOKLYN,NY 11201

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1990年 / 73卷 / 08期

关键词：

characterization; nuclear magnetic resonance; Raman spectroscopy; silicon carbide; solid state;

D O I：

10.1111/j.1151-2916.1990.tb07583.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The present report explores the use of cross‐polarization (CP) and single‐pulse magic angle spinning nuclear magnetic resonance (MAS‐NMR) as well as normal and surfaceenhanced Raman spectroscopy (SERS), in concert, for characterizing highly crystalline polymorphic silicon carbide ceramics. The combined use of these techniques provides a wealth of information regarding bulk, near‐surface, and surface speciation. Both Raman and SERS are promising techniques for fracture surface characterization of these systems. The application of CPMAS‐NMR and SERS to the study of ceramics is reported for the first time in this investigation. Copyright © 1990, Wiley Blackwell. All rights reserved

引用

页码：2242 / 2246

页数：5

共 24 条

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[2]

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[3]

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[4]

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