SPATIAL FIDELITY IN PHOTOREFRACTIVE IMAGE AMPLIFICATION

被引：2

作者：

ZHOU, SM

HE, QB

YEH, PC

LIU, HK

机构：

[1] JET PROP LAB,CTR SPACE MICROELECTR TECHNOL,PASADENA,CA 91109

[2] ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360

来源：

OPTICS COMMUNICATIONS | 1993年 / 99卷 / 1-2期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1016/0030-4018(93)90698-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The spatial fidelity of amplified images in photorefractive materials due to spatial pin variations with computation and experiment based on BaTiO3 is investigated. The results will indicate how the spatial fidelity of the amplified images decreases as the relative aperture of the Fourier transform lens used in the system increases, and varies with the angle between the pump beam and the axis of the signal converging wave.

引用

页码：18 / 24

页数：7

共 7 条

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[7]

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