HIGH-RESOLUTION MEASUREMENT OF BEUTLER-FANO PROFILES FOR AUTOIONIZING RYDBERG SERIES OF XE

被引：19

作者：

MAEDA, K

UEDA, K

NAMIOKA, T

ITO, K

机构：

[1] TOHOKU UNIV, SCI MEASUREMENTS RES INST, SENDAI, MIYAGI 980, JAPAN

[2] PHOTON FACTORY, NATL LAB HIGH ENERGY PHYS, TSUKUBA 305, JAPAN

来源：

PHYSICAL REVIEW A | 1992年 / 45卷 / 01期

关键词：

D O I：

10.1103/PhysRevA.45.527

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Photoabsorption cross sections for the ns' and nd' autoionizing Rydberg series of Xe have been measured with a resolution of 7.4 m angstrom using a high-resolution spectrometer and synchrotron radiation. The cross sections are parametrized with the aid of a line-shape formula that is based on the multichannel-quantum-defect theory and has a form analogous to Fano's resonance formula and are compared in detail with theoretical predictions available in the literature.

引用

页码：527 / 530

页数：4

共 25 条

[1] About the absorption series of argon, krypton and xenon to the term of ionisation boudaries between (2)P(3/2)(0) and (2)P(1/2)(0) [J].