X-RAY DIFFRACTION - NEW HIGH-SPEED TECHNIQUE BASED ON X-RAY SPECTROGRAPHY

[1] APPLICATION OF HIGH-RESOLUTION SEMICONDUCTOR DETECTORS IN X-RAY EMISSION SPECTROGRAPHY [J]. SCIENCE, 1966, 151 (3710) : 562 - &

[2] BRUGGER RM, 1965, THERMAL NEUTRON SCAT, P53

[3] BURKE JJ, 1966, 12 SAG ARM MAT RE ED, P273

[4] DUWEZ P, 1966, PROGR SOL STATE CHEM, V3, P377

[5] EGELSTAFF PA, 1965, THERMAL NEUTRON S ED, P53

[6] GIESSEN BC, 1967, T METALL SOC AIME, V239, P883

[7] GIESSEN BC, 1966, 12 P SAG ARM MAT RES, P273

[8] JAMES RW, 1962, OPTICAL PRINCIPLES D, P6

[9] 1962, INT TABLES XRAY CRYS, V3, P281

[1] APPLICATION OF HIGH-RESOLUTION SEMICONDUCTOR DETECTORS IN X-RAY EMISSION SPECTROGRAPHY [J]. SCIENCE, 1966, 151 (3710) : 562 - &

[2] BRUGGER RM, 1965, THERMAL NEUTRON SCAT, P53

[3] BURKE JJ, 1966, 12 SAG ARM MAT RE ED, P273

[4] DUWEZ P, 1966, PROGR SOL STATE CHEM, V3, P377

[5] EGELSTAFF PA, 1965, THERMAL NEUTRON S ED, P53

[6] GIESSEN BC, 1967, T METALL SOC AIME, V239, P883

[7] GIESSEN BC, 1966, 12 P SAG ARM MAT RES, P273

[8] JAMES RW, 1962, OPTICAL PRINCIPLES D, P6

[9] 1962, INT TABLES XRAY CRYS, V3, P281