PREDICTIONS FOR COMPLETE FRAGMENTATION PATTERNS OF 4D(5/2) PHOTOELECTRONS AND N5-O23O23 (1)S(0) AUGER ELECTRONS OF XENON BASED ON EXPERIMENTAL-DATA AT 94.5-EV PHOTON ENERGY

被引：68

作者：

KAMMERLING, B

SCHMIDT, V

机构：

[1] Fakultät für Physik Universität Freiburg, Freiburg

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1993年 / 26卷 / 06期

关键词：

D O I：

10.1088/0953-4075/26/6/014

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An extensive study of the fragmentation patterns of photoionization from 4d5/2 ionization in xenon observed in coincidence with the subsequent N5-O23O23 S-1(0) Auger electron is given. It is based on the two-step model for photoionization and Auger decay and on a complete set of experimental data for the photoionization process at 94.5 eV photon energy together with simple and energy-independent factors from the selected Auger transition. Fragmentation patterns are discussed for different kinds of light polarization, for energy- and angle-resolved analysis of both coincident electrons and finally for the case of complete differentation of the two with respect to their energies, angles and spin directions.

引用

页码：1141 / 1161

页数：21

共 38 条

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