LIGHT-EMISSION FROM THE TUNNELING JUNCTION OF THE SCANNING TUNNELING MICROSCOPE

被引:36
作者
SMOLYANINOV, II [1 ]
KHAIKIN, MS [1 ]
EDELMAN, VS [1 ]
机构
[1] ACAD SCI USSR,INST PROBLEMS MICROELECTR TECHNOL & SUPERPURE MAT,CHERNOGOLOVKA 142432,USSR
关键词
D O I
10.1016/0375-9601(90)90903-2
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A new light detection method has been applied to study the voltage dependence of light emission from different tunneling junctions of the STM. The emission feature positions depend strongly on the materials used for tip and sample in good accordance with their plasma frequencies. First experiments with copper phthalocyanine molecules in the Au-Au junction have been discussed. © 1990.
引用
收藏
页码:410 / 412
页数:3
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