THICKNESS DEPENDENCE OF INTERBAND TRANSITION PHOTOVOLTAIC VOLTAGE AND SHORT-CIRCUIT PHOTOCURRENT IN ZINC-SULFIDE PHOTOCELLS

被引：3

作者：

ARSALANE, M

TOSSER, AJ

机构：

[1] UNIV HAUTE NORMANDIE,ELECTR AUTOMAT LAB,F-76077 LE HAVRE,FRANCE

[2] UNIV NANCY 1,ELECTR LAB,F-54037 NANCY,FRANCE

来源：

THIN SOLID FILMS | 1977年 / 42卷 / 02期

关键词：

D O I：

10.1016/0040-6090(77)90419-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：213 / 220

页数：8

共 11 条

[1] INTERBAND PHOTOCONDUCTION EDGE IN ZINC-SULFIDE THIN-FILMS [J].

ARSALANE, M ;

TOSSER, A .

NOUVELLE REVUE D OPTIQUE, 1976, 7 (05) :323-327

[2] REVERSAL OF PHOTOVOLTAIC PHENOMENA IN SPUTTERED ZINC-SULFIDE [J].

ARSALANE, M ;

TOSSER, A .

THIN SOLID FILMS, 1975, 28 (02) :L31-L33

[3] COMBINED POOLE-FRENKEL AND SCHOTTKY EFFECT IN INSULATORS [J].

BOON, MR .

THIN SOLID FILMS, 1972, 10 (02) :315-&

[4] POOLE-FRENKEL CONDUCTION IN AMORPHOUS SOLIDS [J].

HILL, RM .

PHILOSOPHICAL MAGAZINE, 1971, 23 (181) :59-&

[5] PHOTOCONDUCTION AND PHOTOVOLTAIC EFFECTS IN THIN-FILMS OF PULVERIZED ZNS [J].

MURRAY, H ;

TOSSER, A .

THIN SOLID FILMS, 1974, 24 (01) :165-180

[6] DIMENSIONAL VARIATIONS OF ELECTRONIC PROPERTIES OF RADIO-FREQUENCY SPUTTERED THIN-FILMS [J].

MURRAY, H .

REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (06) :427-432

[7]

MURRAY H, 1973, THIN SOLID FILMS, V17, P75, DOI 10.1016/0040-6090(73)90007-2

[8] CONDUCTION IN THIN-FILMS OF RF REACTIVELY SPUTTERED ZINC-SULFIDE [J].

MURRAY, H ;

TOSSER, A .

THIN SOLID FILMS, 1974, 22 (01) :37-44

[9] PERTURBATIONS OF THIN SPUTTERED ZINC-SULFIDE CONDUCTION-BAND [J].

TOSSER, A ;

MURRAY, H ;

ARSALANE, M .

THIN SOLID FILMS, 1976, 31 (03) :297-309

[10]

Tosser A., 1975, Electrocomponent Science and Technology, V2, P147, DOI 10.1155/APEC.2.147

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