ELECTRON-INDUCED DISSOCIATION OF MONOLAYER C2H5CL ON AG(111) - ELECTRON-ENERGY DEPENDENCE

被引：21

作者：

LIU, ZM ^{[1
]}

ZHOU, XL ^{[1
]}

WHITE, JM ^{[1
]}

机构：

[1] UNIV TEXAS,DEPT CHEM & BIOCHEM,AUSTIN,TX 78712

来源：

CHEMICAL PHYSICS LETTERS | 1992年 / 198卷 / 06期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0009-2614(92)85038-C

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Electron-induced dissociation (EID) of monolayer C2H5Cl on Ag(111) has been studied using a novel low-energy photoelectron source. As a function of electron energy, the C-Cl bond dissociation cross section drops by more than an order of magnitude between 0.5 and 3 eV. It rises again by an order of magnitude between 8 and 12 eV, and then rises slowly to 50 eV. Above 8 eV, the EID cross section is attributed mainly to n(Cl) and sigma(CCl) valence level ionization, whereas between 0.5 and 3 eV, it is attributed to dissociative electron attachment.

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页码：615 / 620

页数：6

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