X-UV MULTILAYER REFLECTIVITY TESTS USING WINDOWLESS SOFT X-RAYS TUBE AND SYNCHROTRON SOURCE

被引：12

作者：

BARCHEWITZ, R

MARMORET, R

机构：

[1] CTR ETUD BRUYERES LE CHATEL,CEA,F-91680 BRUYERES CHATEL,FRANCE

[2] UNIV PARIS 11,UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1988年 / 23卷 / 10期

关键词：

D O I：

10.1051/rphysap:0198800230100166100

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1661 / 1674

页数：14

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