AN AUTOMATED 60 GHZ OPEN RESONATOR SYSTEM FOR PRECISION DIELECTRIC MEASUREMENT

被引:32
作者
AFSAR, MN
LI, XH
CHI, H
机构
[1] Dept of Electr Eng, Tufts Univ,, Medford, MA
关键词
D O I
10.1109/22.64565
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An automated open resonator system is designed and constructed for precision measurement of the loss tangent and dielectric permittivity of low absorbing materials at 60 GHz. The use of a high-Q hemispherical Fabry-Perot cavity together with highly stabilized synthesized phase locked Gunn oscillator sources and a superheterodyne receiver enabled us to measure loss tangent value as low as 10-mu-rad. Both cavity length variation and frequency variation techniques were utilized to provide precise data.
引用
收藏
页码:1845 / 1853
页数:9
相关论文
共 13 条
[3]  
AFSAR MN, 1990, JUN P C PREC EL MEAS, P238
[4]  
Anderson M.V., 1962, P IEE, V109, P820, DOI [10.1049/pi-b-2.1962.0140, DOI 10.1049/PI-B-2.1962.0140]
[5]   FABRY-PEROT AND OPEN RESONATORS AT MICROWAVE AND MILLIMETER WAVE FREQUENCIES, 2-300 GHZ [J].
CLARKE, RN ;
ROSENBERG, CB .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1982, 15 (01) :9-24
[6]   ACCURATE MEASUREMENT OF PERMITTIVITY BY MEANS OF AN OPEN RESONATOR [J].
CULLEN, AL ;
YU, PK .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 325 (1563) :493-&
[7]  
CULLEN AL, 1972, MAR P HIGH FREQ DIEL, P73
[9]   A QUASI-OPTICS PERTURBATION TECHNIQUE FOR MEASURING DIELECTRIC CONSTANTS [J].
DEGENFORD, JE ;
COLEMAN, PD .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (04) :520-+
[10]   PRECISE DIELECTRIC MEASUREMENTS AT 35 GHZ USING AN OPEN MICROWAVE RESONATOR [J].
JONES, RG .
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1976, 123 (04) :285-290